SINGLE EVENT UPSET
SINGLE EVENT UPSET INTRODUCTION : A single - event upset ( SEU ) , also known as a single - event error ( SEE ) , is a change of state caused by one single ionizing particle ( ions , electrons , photons... ) striking a sensitive node in a micro - electronic device , such as in a microprocessor , semiconductor memory , or power transistors . The state change is a result of the free charge created by ionization in or close to an important node of a logic element ( e.g. memory " bit " ) . The error in device output or operation caused as a result of the strike is called an SEU or a soft error . The SEU itself is not considered permanently damaging to the transistor's or circuit's functionality unlike the case of single - event latch - up ( SEL ) , single - event gate rupture ( SEGR ) , or single - event burnout ( SEB ) . These are all examples of a general...